간단하게 확인할 수 있는 첫 번째 강의의 샘플 (5분) 영상입니다.
우원식 TL
NAND PI
NOR Flash/SRAM 소자
NAND Flash Memory 불량 분석 (120/90/70/60/41nm)
NAND Flash Memory 소자 및 Process Integration
(26/20/16nm - 2D, 72단/96단 - 3D)
강의 Summary
NAND Flash Memory는 비휘발성 및 낮은 Cost의 특성으로 Storage Memory 역할로
Personal Computer, Smart Phone 및 여러 다양한 Solution 제품에서 주로 사용합니다.
이 강의에서는 NAND Flash Memory의 특성 관련 주제를 다룹니다.
Memory 안에서 NAND Flash Memory의 위치와 기본적인 동작을 이해하고
3D NAND Flash Memory 소자 특성과, 신뢰성에 대한 학습을 통해
추후 발전 가능성에 대하여 생각해 봅니다.
강의 목차
1강. Introduction - NAND Positioning & Basics (Lv.1)
1) Introduction
- NAND Positioning & Basics @Memory
2) Basic Operation & Structure
- Intrinsic Operation with Structure
3) 3D NAND & Bit Growth
- Concept of 3D NAND & Method of Bit Growth
4) 04 Characteristics & Reliability
- NAND Requirement as Characteristics & Reliability
2강. Basic Operation & Structure - Intrinsic Operation with Structure (Lv.2)
1) Introduction
2) Basic Operation & Structure
- Device Intrinsic Operation
- Charge Storing Mechanism
- Cell Hierarchy (1)
- Cell Hierarchy (2)
- Operation Feature
- Cell Architecture
- Ex.) Read Operation
- Basic Operation Summary
- Cell Structure (Video)
3) 3D NAND & Bit Growth
4) Characteristics & Reliability
3강. 3D NAND & Bit Growth - Concept of 3D NAND & Method of Bit Growth (Lv.3)
1) NAND Positioning
2) 반도체 Chip 관련 기본 용어 설명
3) 3D NAND & Bit Growth
- 3D CTD Nand Flash ?
- 3D Cell Structure
- Comparison for 2D FG & 3D CTD
- Plug & Slim Process Concept
- Bit Growth @Nand Flash
- Logical Bit Density
- 2D vs 3D Nand Flash
- 4D Nand Flash
4) Characteristics & Reliability 구성
4강. Characteristics & Reliability - NAND Requirement as Characteristics & Reliability (Lv.3)
1) NAND Positioning
2) 반도체 chip 관련 기본 용어 설명
3) 3D NAND & Bit Growth
4) Characteristics & Reliability
- Key Requirement for CTD Nand Cell
- (Fowler-Nordheim)F-N Tunneling
- Basic Program Operation
- FN Program Model
- Basic Erase Operation
- Concept of Reliability
- Cause of Reliability
- Improvement of Reliability
- CTD Retention Model